Kelvin probe force microscopy in liquid using electrochemical force microscopy
Conventional closed loop-Kelvin probe force microscopy (KPFM) has emerged as a powerful technique for probing electric and transport phenomena at the solid–gas interface. The extension of KPFM capabilities to probe electrostatic and electrochemical phenomena at the solid–liquid interface is of inter...
Main Authors: | , , , , , , |
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Format: | Article |
Language: | English |
Published: |
Beilstein-Institut
2015-01-01
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Series: | Beilstein Journal of Nanotechnology |
Subjects: | |
Online Access: | https://doi.org/10.3762/bjnano.6.19 |