Investigation of structural and reflective characteristics of short-period Mo/B4C multilayer X-ray mirrors

Investigation of structural and reflective characteristics of short-period Mo/B4C multilayer X-ray mirrors

The results of a study of the structural and reflective characteristics of short-period multilayer X-ray mirrors based on Mo/B4C at wavelengths 1.54 Å, 9.89 Å and 17.59 Å are presented. The period of the samples varied in the range 8–35 Å. The average widths of the interfaces were ∼3.5 and 2.2 Å at...

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Bibliographic Details
Main Authors: Roman Shaposhnikov, Vladimir Polkovnikov, Sergey Garakhin, Yuliy Vainer, Nikolay Chkhalo, Ruslan Smertin, Kirill Durov, Egor Glushkov, Sergey Yakunin, Mikhail Borisov
Format: Article
Language:English
Published: International Union of Crystallography 2024-03-01
Series:Journal of Synchrotron Radiation
Subjects:
x-ray multilayer mirrors
synchrotron applications
x-ray monochromators
Online Access:http://scripts.iucr.org/cgi-bin/paper?S1600577524000419

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http://scripts.iucr.org/cgi-bin/paper?S1600577524000419

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