Structural Characterization of ZnO Thin Films Deposited onto Silicon Substrates using Cathodic Magnetron Sputtering

Structural Characterization of ZnO Thin Films Deposited onto Silicon Substrates using Cathodic Magnetron Sputtering

In this study, we analyzed Zinc Oxide (ZnO) thin films deposited on silicon substrates using magnetron sputtering. These films have numerous applications in photovoltaic and optoelectronic devices due to their excellent physique properties. We used two structural characterization techniques: X-ray d...

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Bibliographic Details
Main Authors: Leila Ghalmi, Souhila Bensmaine, Chems El Hayat Merzouk
Format: Article
Language:English
Published: Renewable Energy Development Center (CDER) 2023-07-01
Series:Revue des Énergies Renouvelables
Subjects:
zinc oxide zno
thin films
magnetron sputtering
x-ray diffraction (xrd)
scanning electron microscopy (sem)
Online Access:https://revue.cder.dz/index.php/rer/article/view/1116

Internet

https://revue.cder.dz/index.php/rer/article/view/1116

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