ON THE TECHNIQUE OF PREPARING SAMPLES TO STUDY FRACTAL DIMENSION AND ELECTRICAL PROPERTIES OF SAMPLES USING A SCANNING TUNNELING MICROSCOPE
In this paper the technique of preparation of samples for the study of fractal dimension and obtaining the current-voltage characteristics using a scanning tunneling microscope has been demonstrated.
| Main Authors: | , , , |
|---|---|
| Format: | Article |
| Language: | Russian |
| Published: |
Tver State University
2014-11-01
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| Series: | Физико-химические аспекты изучения кластеров, наноструктур и наноматериалов |
| Subjects: | |
| Online Access: | http://physchemaspects.ru/archives/2014/%D0%A4%D0%A5-2014.%20%D0%90%D0%BD%D1%82%D0%BE%D0%BD%D0%BE%D0%B2%20%D0%90%D0%A1.pdf |