Development of a lifetime evaluation system and lifetime prediction method for GaN RF semiconductors used in manned and unmanned weapon systems
The aim of this study is to develop a testing system that applies RF (Radio Frequency) stress to predict the lifespan of GaN RF semiconductors, a subject of numerous ongoing domestication studies. Additionally, the study proposes an approach that considers the complex effects of degradation mechani...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Institute of Defense Acquisition Program
2023-09-01
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| Series: | 선진국방연구 |
| Subjects: | |
| Online Access: | https://journal.idap.re.kr/index.php/JAMS/article/view/208 |