Applying Speckle Noise Suppression to Refractive Indices Change Detection in Porous Silicon Microarrays
The gray value method can be used to detect gray value changes of each unit almost parallel to the surface image of PSi (porous silicon) microarrays and indirectly measure the refractive index changes of each unit. However, the speckles of different noise intensities produced by lasers on a porous s...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2019-07-01
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| Series: | Sensors |
| Subjects: | |
| Online Access: | https://www.mdpi.com/1424-8220/19/13/2975 |