Compensation for Process and Temperature Dependency in a CMOS Image Sensor

Compensation for Process and Temperature Dependency in a CMOS Image Sensor

This paper analyzes and compensates for process and temperature dependency among a (Complementary Metal Oxide Semiconductor) CMOS image sensor (CIS) array. Both the analysis and compensation are supported with experimental results on the CIS’s dark current, dark signal non-uniformity (DSNU...

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Bibliographic Details
Main Authors: Shuang Xie, Albert Theuwissen
Format: Article
Language:English
Published: MDPI AG 2019-02-01
Series:Sensors
Subjects:
temperature sensors
delta-sigma (Δ-σ) modulator
CMOS image sensor (CIS)
thermal compensation
dark current
dark signal non-uniformity (DSNU)
process variability
process variations
conversion gain (CG)
Online Access:https://www.mdpi.com/1424-8220/19/4/870

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https://www.mdpi.com/1424-8220/19/4/870

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