NORMALIZATION BASED ON THICKNESS AND PARAMETRIZATION OF CONTOUR LINES ON IMAGES
The method of normalization of planimetric lines on thickness based on the mask analysis of local orientations of their fragments is offered. Comparison of the offered method with known methods of a skeletization is made. It is shown that the offered method surpasses known methods of a skeletization...
| প্রধান লেখক: | , , , |
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| বিন্যাস: | প্রবন্ধ |
| ভাষা: | Russian |
| প্রকাশিত: |
Educational institution «Belarusian State University of Informatics and Radioelectronics»
2019-06-01
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| মালা: | Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki |
| বিষয়গুলি: | |
| অনলাইন ব্যবহার করুন: | https://doklady.bsuir.by/jour/article/view/569 |