Direct probing of semiconductor barium titanate via electrostatic force microscopy Sondagem direta de titanato de bário semicondutorpor meio de microscopia de força eletrostática
Electrostatic force microscopy (EFM) was used to directly probe surface potential in doped barium titanate semiconducting ceramics. EFM measurements were performed using noncontact scans at a constant tip-sample separation of 75 nm with varied bias voltages applied to the sample. The applied voltage...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Associação Brasileira de Cerâmica
2007-06-01
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| Series: | Cerâmica |
| Subjects: | |
| Online Access: | http://www.scielo.br/scielo.php?script=sci_arttext&pid=S0366-69132007000200015 |