Carrier-envelope-phase tagging in measurements with long acquisition times

Carrier-envelope-phase tagging in measurements with long acquisition times

We present a detailed analysis of the systematic errors that affect single-shot carrier envelope phase (CEP) measurements in experiments with long acquisition times, for which only limited long-term laser stability can be achieved. After introducing a scheme for eliminating these systematic errors t...

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Bibliographic Details
Main Authors: M Kübel, K J Betsch, Nora G Johnson, U Kleineberg, R Moshammer, J Ullrich, G G Paulus, M F Kling, B Bergues
Format: Article
Language:English
Published: IOP Publishing 2012-01-01
Series:New Journal of Physics
Online Access:https://doi.org/10.1088/1367-2630/14/9/093027

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https://doi.org/10.1088/1367-2630/14/9/093027

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