Longitudinal strain of epitaxial graphene monolayers on SiC substrates evaluated by z-polarization Raman microscopy
Longitudinal strains in epitaxial monolayer graphene (EMG) grown on SiC substrates were evaluated by z-polarization Raman microscopy. Due to the covalent bonds formed at the interface between graphene and the substrate, strong compressive strains were loaded on the EMG, which were sensitively detect...
| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2019-06-01
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| Series: | AIP Advances |
| Online Access: | http://dx.doi.org/10.1063/1.5099430 |