A Probabilistic Physico-Chemical Diffusion Model of the Key Drifting Parameter of Measuring Equipment

(1) Background: A new probabilistic physico-chemical model of the drifting key parameter of measuring equipment is proposed. The model allows for the integrated consideration of degradation processes (electrolytic corrosion, oxidation, plastic accumulation of dislocations, etc.) in nodes and element...

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Bibliographic Details
Main Author: Rustam Khayrullin
Format: Article
Language:English
Published: MDPI AG 2024-01-01
Series:Axioms
Subjects:
Online Access:https://www.mdpi.com/2075-1680/13/1/41