Mechanistic insights into single crystal cadmium whisker growth on Ti2Cd intermetallic

Metal whisker growth poses a significant reliability threat to electronic devices. Previous investigations have predominantly focused on metal platings and alloy solder samples, yet the intricate factors involved have yielded inconsistent comprehension of the phenomenon. To achieve a comprehensive u...

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Bibliographic Details
Main Authors: Yuxin Shi, Jingwen Tang, Wanjie Sun, Haifeng Tang, Xinxin Xia, Tianyu Wang, Jianxiang Ding, Peigen Zhang, ZhengMing Sun
Format: Article
Language:English
Published: Elsevier 2023-09-01
Series:Journal of Materials Research and Technology
Subjects:
Online Access:http://www.sciencedirect.com/science/article/pii/S2238785423022822