Noise performance of frequency modulation Kelvin force microscopy

Noise performance of frequency modulation Kelvin force microscopy

Noise performance of a phase-locked loop (PLL) based frequency modulation Kelvin force microscope (FM-KFM) is assessed. Noise propagation is modeled step by step throughout the setup using both exact closed loop noise gains and an approximation known as “noise gain” from operational amplifier (OpAmp...

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Bibliographic Details
Main Authors: Heinrich Diesinger, Dominique Deresmes, Thierry Mélin
Format: Article
Language:English
Published: Beilstein-Institut 2014-01-01
Series:Beilstein Journal of Nanotechnology
Subjects:
dynamic
frequency noise
Kelvin force microscopy
noise performance
phase noise
thermal excitation
Online Access:https://doi.org/10.3762/bjnano.5.1

Internet

https://doi.org/10.3762/bjnano.5.1

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