Physical properties enhancement of porous silicon treated with In2O3 as a antireflective coating
In this work, we investigate the effect of Indium Oxide (In2O3) on the microstructural, optical, optoelectrical, and electrical properties of Porous Silicon (PS) layer. PS film was prepared by electrochemical anodization technique. In2O3 thin film was coated onto PS layer by using simple chemical im...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2019-03-01
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| Series: | Results in Physics |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S2211379718334764 |