Correlative force and tip-enhanced Raman microscopy
Tip-enhanced Raman scattering (TERS) microscopy attracts increasing attention for visualization and characterization of strain distribution on crystalline samples at a nanoscale due to nano-sized fields localized at a metal tip. However, as the metal tip approaches close to a sample surface, a force...
| Main Authors: | , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2019-02-01
|
| Series: | APL Photonics |
| Online Access: | http://dx.doi.org/10.1063/1.5064546 |