Prediction of Single Event Effects in FinFET Devices Based on Deep Learning

Prediction of Single Event Effects in FinFET Devices Based on Deep Learning

The Single Event Effect (SEE) of FinFET devices has become one of the challenging issues affecting the reliability of modern electronic systems in space and terrestrial applications. However, the conventional FinFET device simulation steps are tedious and take a long time. This paper proposes a meth...

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Bibliographic Details
Main Authors: Haiyu Liu, Shulong Wang, Rong Zhao, Hao Ma, Lan Ma, Shijie Liu, Shupeng Chen, Hongxia Liu
Format: Article
Language:English
Published: IEEE 2023-01-01
Series:IEEE Journal of the Electron Devices Society
Subjects:
Deep learning
neural networks
FinFET
single event effect (SEE)
drain transient current pulse
Online Access:https://ieeexplore.ieee.org/document/10225300/

Internet

https://ieeexplore.ieee.org/document/10225300/

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