An Improved Matrix Generation Framework for Thermal Aware Placement in VLSI

An Improved Matrix Generation Framework for Thermal Aware Placement in VLSI

Since hotspots and temperature gradients are reliability and performance-critical issues in processors, thermal awareness finds a vital place in the processor design cycle. Incorporating thermal awareness at the level of physical design, this work proposes a new, fast, and efficient thermal aware pl...

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Bibliographic Details
Main Authors: Somnath Roy Choudhury, Sambhu Nath Pradhan
Format: Article
Language:English
Published: IEEE 2020-01-01
Series:IEEE Access
Subjects:
Hotspots
temperature gradients
simulated annealing
matrix synthesis problem
gate arrays
Online Access:https://ieeexplore.ieee.org/document/9272957/

Internet

https://ieeexplore.ieee.org/document/9272957/

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