Thermal response of active Si in press-fit rectifier diodes by confocal Raman microscopy: Influence of diode design and technology
Overheating resulting from the circulation of high electric currents (in the order of tens of amperes) that some electronic devices undergo when they are in operation, can induce structural modifications such as mechanical stresses that could reduce their lifetime. In order to optimize their perform...
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2022-05-01
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| Series: | Journal of Materials Research and Technology |
| Subjects: | |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S2238785422004240 |