In Situ Roughness Measurements for the Solar Cell Industry Using an Atomic Force Microscope

In Situ Roughness Measurements for the Solar Cell Industry Using an Atomic Force Microscope

Areal roughness parameters always need to be under control in the thin film solar cell industry because of their close relationship with the electrical efficiency of the cells. In this work, these parameters are evaluated for measurements carried out in a typical fabrication area for this industry....

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Bibliographic Details
Main Authors: Higinio González-Jorge, Victor Alvarez-Valado, Jose Luis Valencia, Soledad Torres
Format: Article
Language:English
Published: MDPI AG 2010-04-01
Series:Sensors
Subjects:
surface metrology
atomic force microscopy
solar cell
transparent conductive oxide
areal roughness
Online Access:http://www.mdpi.com/1424-8220/10/4/4002/

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http://www.mdpi.com/1424-8220/10/4/4002/

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