In Situ Roughness Measurements for the Solar Cell Industry Using an Atomic Force Microscope
Areal roughness parameters always need to be under control in the thin film solar cell industry because of their close relationship with the electrical efficiency of the cells. In this work, these parameters are evaluated for measurements carried out in a typical fabrication area for this industry....
| Auteurs principaux: | , , , |
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| Format: | Article |
| Langue: | English |
| Publié: |
MDPI AG
2010-04-01
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| Collection: | Sensors |
| Sujets: | |
| Accès en ligne: | http://www.mdpi.com/1424-8220/10/4/4002/ |