X-ray Hanbury Brown-Twiss interferometry for determination of ultrashort electron-bunch duration

X-ray Hanbury Brown-Twiss interferometry for determination of ultrashort electron-bunch duration

An x-ray Hanbury Brown-Twiss interferometry to diagnose a temporal profile of a femtosecond electron bunch (e-bunch) is presented. We show that intensity interference of spontaneous x-ray radiation from the e-bunch reflects the e-bunch profile. Based on this relationship, a temporal profile of the 8...

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Bibliographic Details
Main Authors: Ichiro Inoue, Toru Hara, Yuichi Inubushi, Kensuke Tono, Takahiro Inagaki, Tetsuo Katayama, Yoshiyuki Amemiya, Hitoshi Tanaka, Makina Yabashi
Format: Article
Language:English
Published: American Physical Society 2018-08-01
Series:Physical Review Accelerators and Beams
Online Access:http://doi.org/10.1103/PhysRevAccelBeams.21.080704

Internet

http://doi.org/10.1103/PhysRevAccelBeams.21.080704

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