Remote Phonon Scattering in Two-Dimensional InSe FETs with High-<i>κ</i> Gate Stack

This work focuses on the effect of remote phonon arising from the substrate and high-<i>&#954;</i> gate dielectric on electron mobility in two-dimensional (2D) InSe field-effect transistors (FETs). The electrostatic characteristic under quantum confinement is derived by self-consiste...

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Bibliographic Details
Main Authors: Pengying Chang, Xiaoyan Liu, Fei Liu, Gang Du
Format: Article
Language:English
Published: MDPI AG 2018-12-01
Series:Micromachines
Subjects:
Online Access:https://www.mdpi.com/2072-666X/9/12/674