All-fiber ellipsometer for nanoscale dielectric coatings

All-fiber ellipsometer for nanoscale dielectric coatings

Multiple mode resonance shifts in tilted fiber Bragg gratings (TFBGs) are used to simultaneously measure the thickness and the refractive index of TiO2 thin films formed by Atomic Layer Deposition (ALD) on optical fibers. This is achieved by comparing the experimental wavelength shifts of 8 TFBG res...

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Bibliographic Details
Main Authors: Jose Javier Imas, Ignacio R. Matías, Ignacio Del Villar, Aritz Ozcáriz, Carlos Ruiz Zamarreño, Jacques Albert
Format: Article
Language:English
Published: Institue of Optics and Electronics, Chinese Academy of Sciences 2023-10-01
Series:Opto-Electronic Advances
Subjects:
tilted fiber bragg grating (tfbg)
mode transition
ellipsometer
Online Access:https://www.oejournal.org/article/doi/10.29026/oea.2023.230048

Internet

https://www.oejournal.org/article/doi/10.29026/oea.2023.230048

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