Characterization of CdO film AFM and XRD Diffraction Using Rietveld Refinement

Nano particles of Cadmium Oxide (CdO) thin films were prepared by spray pyrolysis technique. The synthesized film is annealed at (200 , 300, 450) o C for 3 hours .  The XRD and AFM for the analysis of its structural and micro-structural characteristic has been preformed. The average grain size was...

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Bibliographic Details
Main Authors: Tarq A. Al-Dhahir, Ziad T. Khodair
Format: Article
Language:English
Published: University of Baghdad 2017-04-01
Series:Ibn Al-Haitham Journal for Pure and Applied Sciences
Subjects:
Online Access:https://jih.uobaghdad.edu.iq/index.php/j/article/view/364