Skewness-based characterization of silicon photomultipliers
Abstract Characterization of SiPMs is an objective of high importance in almost any research, development, and application of these unique photon detectors. Two decades of characterization method developments resulted in a comprehensive and elegant methodology based on a precisely resolved number of...
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| Format: | Article |
| Language: | English |
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SpringerOpen
2022-05-01
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| Series: | European Physical Journal C: Particles and Fields |
| Online Access: | https://doi.org/10.1140/epjc/s10052-022-10444-4 |