Measuring the Bandgap of Ambipolar 2D Semiconductors using Multilayer Graphene Contact
The bandgaps of monolayers and few layers in 2D semiconductors are usually measured by optical probing such as photoluminescence (PL). However, if their exfoliated thickness is as large as a few nanometers (multilayer over ≈5 L), PL measurements become less effective and inaccurate because the optic...
| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Wiley-VCH
2023-02-01
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| Series: | Small Science |
| Subjects: | |
| Online Access: | https://doi.org/10.1002/smsc.202200075 |