Physico-Chemical Surface Modifications of Polyetheretherketone (PEEK) Using Extreme Ultraviolet (EUV) Radiation and EUV-Induced Nitrogen Plasma

Physico-Chemical Surface Modifications of Polyetheretherketone (PEEK) Using Extreme Ultraviolet (EUV) Radiation and EUV-Induced Nitrogen Plasma

In this work, the effect of extreme ultraviolet (EUV) radiation and the combination of EUV radiation and low-temperature nitrogen plasma on the physico-chemical properties of polyetheretherketone (PEEK) surfaces were presented. The laser-plasma EUV source based on a double gas puff target was used i...

Full description

Bibliographic Details
Main Authors: Joanna Czwartos, Bogusław Budner, Andrzej Bartnik, Przemysław Wachulak, Henryk Fiedorowicz, Zygmunt Mierczyk
Format: Article
Language:English
Published: MDPI AG 2020-10-01
Series:Materials
Subjects:
PEEK
surface modifications
surface chemistry
XPS analysis
AFM
extreme ultraviolet (EUV)
Online Access:https://www.mdpi.com/1996-1944/13/19/4466

Internet

https://www.mdpi.com/1996-1944/13/19/4466

Similar Items