Modeling a domain wall network in BiFeO3 with stochastic geometry and entropy-based similarity measure

A compact and tractable two-dimensional model to generate the topological network structure of domain walls in BiFeO3 thin films is presented in this study. Our method combines the stochastic geometry parametric model of the centroidal Voronoi tessellation optimized using the von Neumann entropy, a...

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Bibliographic Details
Main Authors: Davide Cipollini, Andele Swierstra, Lambert Schomaker
Format: Article
Language:English
Published: Frontiers Media S.A. 2024-01-01
Series:Frontiers in Materials
Subjects:
Online Access:https://www.frontiersin.org/articles/10.3389/fmats.2024.1323153/full