O<sub>2</sub> and H<sub>2</sub>O Barrier-Based High Reliability and Stability Using Polytetrafluoroethylene Passivation Layer for Solution Processed Indium Oxide Thin Film Transistors
The excellent chemical stability and hydrophobicity of Polytetrafluoroethylene (PTFE) polymer lead to its applicability in high-performance flexible electronic appliances. Though the detailed investigation for PTFE passivated metal oxide thin-film transistors (TFTs) is still lacking. Here, we report...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2022-01-01
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| Series: | IEEE Journal of the Electron Devices Society |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/9852809/ |