Study the effect of temperature variation and intrinsic layer thickness on the linear response of a PIN photodetector: A finite element method approach
Perhaps mentioning the place of Silicon Valley semiconductor companies in business and technology is enough to remind the place of semiconductors in today's world. One of the applications of semiconductors is in manufacturing detection devices. This research aims to investigate the linearity of...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2023-03-01
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| Series: | Results in Engineering |
| Subjects: | |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S2590123022004807 |