Collective laser‐assisted bonding process for 3D TSV integration with NCP
Laser‐assisted bonding (LAB) is an advanced technology in which a homogenized laser beam is selectively applied to a chip. Previous researches have demonstrated the feasibility of using a single‐tier LAB process for 3D through‐silicon via (TSV) integration with nonconductive paste (NCP), where each...
Main Authors: | , , , , , |
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Format: | Article |
Language: | English |
Published: |
Electronics and Telecommunications Research Institute (ETRI)
2019-04-01
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Series: | ETRI Journal |
Subjects: | |
Online Access: | https://doi.org/10.4218/etrij.2018-0171 |