Imaging built-in electric fields and light matter by Fourier-precession TEM

Abstract We report the precise measurement of electric fields in nanostructures, and high-contrast imaging of soft matter at ultralow electron doses by transmission electron microscopy (TEM). In particular, a versatile method based on the theorem of reciprocity is introduced to enable differential p...

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Bibliographic Details
Main Authors: Tizian Lorenzen, Benjamin März, Tianhao Xue, Andreas Beyer, Kerstin Volz, Thomas Bein, Knut Müller-Caspary
Format: Article
Language:English
Published: Nature Portfolio 2024-01-01
Series:Scientific Reports
Online Access:https://doi.org/10.1038/s41598-024-51423-x