Genome-Wide Association Mapping Indicates Quantitative Genetic Control of Spot Blotch Resistance in Bread Wheat and the Favorable Effects of Some Spot Blotch Loci on Grain Yield

Genome-Wide Association Mapping Indicates Quantitative Genetic Control of Spot Blotch Resistance in Bread Wheat and the Favorable Effects of Some Spot Blotch Loci on Grain Yield

Spot blotch caused by the fungus Bipolaris sorokiniana poses a serious threat to bread wheat production in warm and humid wheat-growing regions of the world. Hence, the major objective of this study was to identify consistent genotyping-by-sequencing (GBS) markers associated with spot blotch resista...

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Bibliographic Details
Main Authors: Philomin Juliana, Xinyao He, Jesse Poland, Sandesh Shrestha, Arun K. Joshi, Julio Huerta-Espino, Velu Govindan, Leonardo Abdiel Crespo-Herrera, Suchismita Mondal, Uttam Kumar, Pradeep K. Bhati, Manish Vishwakarma, Ravi P. Singh, Pawan K. Singh
Format: Article
Language:English
Published: Frontiers Media S.A. 2022-03-01
Series:Frontiers in Plant Science
Subjects:
wheat
spot blotch
GWAS
2NS translocation
grain yield
Bipolaris sorokiniana
Online Access:https://www.frontiersin.org/articles/10.3389/fpls.2022.835095/full

Internet

https://www.frontiersin.org/articles/10.3389/fpls.2022.835095/full

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