Scan-Chain-Fault Diagnosis Using Regressions in Cryptographic Chips for Wireless Sensor Networks

Scan-Chain-Fault Diagnosis Using Regressions in Cryptographic Chips for Wireless Sensor Networks

Scan structures, which are widely used in cryptographic circuits for wireless sensor networks applications, are essential for testing very-large-scale integration (VLSI) circuits. Faults in cryptographic circuits can be effectively screened out by improving testability and test coverage using a scan...

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Bibliographic Details
Main Authors: Hyunyul Lim, Minho Cheong, Sungho Kang
Format: Article
Language:English
Published: MDPI AG 2020-08-01
Series:Sensors
Subjects:
cryptography
wireless sensor networks
machine learning
scan-chain diagnosis
Online Access:https://www.mdpi.com/1424-8220/20/17/4771

Internet

https://www.mdpi.com/1424-8220/20/17/4771

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