A novel method to design and evaluate artificial neural network for thin film thickness measurement traceable to the length standard

Abstract The artificial neural networks (ANNs) have been often used for thin-film thickness measurement, whose performance evaluations were only conducted at the level of simple comparisons with the existing analysis methods. However, it is not an easy and simple way to verify the reliability of an...

Full description

Bibliographic Details
Main Authors: Joonyoung Lee, Jonghan Jin
Format: Article
Language:English
Published: Nature Portfolio 2022-02-01
Series:Scientific Reports
Online Access:https://doi.org/10.1038/s41598-022-06247-y