Complex Permittivity Measurement of Low-Loss Anisotropic Dielectric Materials at Hundreds of Megahertz
Resonant methods are well known for their accuracy in determining the complex permittivity of materials. However, to guarantee the accuracy, interference modes must be suppressed in the measurement band. In this paper, a multi-mode split rectangular cavity is designed and fabricated to measure low-l...
| Main Authors: | , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2022-06-01
|
| Series: | Electronics |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2079-9292/11/11/1769 |