Detection of thin film phase transformations at high-pressure and high-temperature in a diamond anvil cell

Detection of thin film phase transformations at high-pressure and high-temperature in a diamond anvil cell

Abstract Quantifying how grain size and/or deviatoric stress impact (Mg,Fe)2SiO4 phase stability is critical for advancing our understanding of subduction processes and deep-focus earthquakes. Here, we demonstrate that well-resolved X-ray diffraction patterns can be obtained on nano-grained thin fil...

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Bibliographic Details
Main Authors: Meryem Berrada, Genzhi Hu, Dongyuan Zhou, Siheng Wang, Phuong Q. H. Nguyen, Dongzhou Zhang, Vitali Prakapenka, Stella Chariton, Bin Chen, Jie Li, Jason D. Nicholas
Format: Article
Language:English
Published: Nature Portfolio 2024-02-01
Series:Communications Earth & Environment
Online Access:https://doi.org/10.1038/s43247-024-01234-9

Internet

https://doi.org/10.1038/s43247-024-01234-9

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