Morphology and Optical Properties of Thin Cd<sub>3</sub>As<sub>2</sub> Films of a Dirac Semimetal Compound

Morphology and Optical Properties of Thin Cd<sub>3</sub>As<sub>2</sub> Films of a Dirac Semimetal Compound

Using atomic-force microscopy (AFM) and wide-band (0.02–8.5 eV) spectroscopic ellipsometry techniques, we investigated the morphology and optical properties of Cd<inline-formula><math display="inline"><semantics><msub><mrow></mrow><mn>3</mn>&...

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Bibliographic Details
Main Authors: Natalia Kovaleva, Ladislav Fekete, Dagmar Chvostova, Andrei Muratov
Format: Article
Language:English
Published: MDPI AG 2020-10-01
Series:Metals
Subjects:
Dirac semimetals
cadmium arsenide
thin films
atomic force microscopy
spectroscopic ellipsometry
Online Access:https://www.mdpi.com/2075-4701/10/10/1398

Internet

https://www.mdpi.com/2075-4701/10/10/1398

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