PbI2‐DMSO Assisted In Situ Growth of Perovskite Wafers for Sensitive Direct X‐Ray Detection

PbI2‐DMSO Assisted In Situ Growth of Perovskite Wafers for Sensitive Direct X‐Ray Detection

Abstract Although perovskite wafers with a scalable size and thickness are suitable for direct X‐ray detection, polycrystalline perovskite wafers have drawbacks such as the high defect density, defective grain boundaries, and low crystallinity. Herein, PbI2‐DMSO powders are introduced into the MAPbI...

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Bibliographic Details
Main Authors: Wenjun Liu, Tongyu Shi, Jiongtao Zhu, Zhenyu Zhang, Dong Li, Xingchen He, Xiongsheng Fan, Lingqiang Meng, Jiahong Wang, Rui He, Yongshuai Ge, Yanliang Liu, Paul K. Chu, Xue‐Feng Yu
Format: Article
Language:English
Published: Wiley 2023-01-01
Series:Advanced Science
Subjects:
defects density
in situ growth
PbI2‐DMSO
perovskite wafer
perovskite X‐ray detection
Online Access:https://doi.org/10.1002/advs.202204512

Internet

https://doi.org/10.1002/advs.202204512

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