Currents Induced by Injected Charge in Junction Detectors

The problem of drifting charge-induced currents is considered in order to predict the pulsed operational characteristics in photo-and particle-detectors with a junction controlled active area. The direct analysis of the field changes induced by drifting charge in the abrupt junction devices with a p...

Full description

Bibliographic Details
Main Authors: Vidas Kalesinskas, Tomas Ceponis, Eugenijus Gaubas
Format: Article
Language:English
Published: MDPI AG 2013-09-01
Series:Sensors
Subjects:
Online Access:http://www.mdpi.com/1424-8220/13/9/12295