Performance Degradation Modeling and Its Prediction Algorithm of an IGBT Gate Oxide Layer Based on a CNN-LSTM Network

Performance Degradation Modeling and Its Prediction Algorithm of an IGBT Gate Oxide Layer Based on a CNN-LSTM Network

The problem of health status prediction of insulated-gate bipolar transistors (IGBTs) has gained significant attention in the field of health management of power electronic equipment. The performance degradation of the IGBT gate oxide layer is one of the most important failure modes. In view of fail...

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Bibliographic Details
Main Authors: Xin Wang, Zhenwei Zhou, Shilie He, Junbin Liu, Wei Cui
Format: Article
Language:English
Published: MDPI AG 2023-04-01
Series:Micromachines
Subjects:
IGBT
gate oxide layer degradation
feature fusion
performance prediction
CNN-LSTM network
Online Access:https://www.mdpi.com/2072-666X/14/5/959

Internet

https://www.mdpi.com/2072-666X/14/5/959

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