Characterisation of the Material and Mechanical Properties of Atomic Force Microscope Cantilevers with a Plan-View Trapezoidal Geometry

Characterisation of the Material and Mechanical Properties of Atomic Force Microscope Cantilevers with a Plan-View Trapezoidal Geometry

Cantilever devices have found applications in numerous scientific fields and instruments, including the atomic force microscope (AFM), and as sensors to detect a wide range of chemical and biological species. The mechanical properties, in particular, the spring constant of these devices is crucial w...

Full description

Bibliographic Details
Main Authors: Ashley D. Slattery, Adam J. Blanch, Cameron J. Shearer, Andrew J. Stapleton, Renee V. Goreham, Sarah L. Harmer, Jamie S. Quinton, Christopher T. Gibson
Format: Article
Language:English
Published: MDPI AG 2019-06-01
Series:Applied Sciences
Subjects:
trapezoidal cantilever
atomic force microscopy
spring constant
calibration
Online Access:https://www.mdpi.com/2076-3417/9/13/2604

Internet

https://www.mdpi.com/2076-3417/9/13/2604

Similar Items