Controlled Sixfold Symmetric Exfoliation of Oriented MoS2 Monolayers by Coulomb Force

Controlled Sixfold Symmetric Exfoliation of Oriented MoS2 Monolayers by Coulomb Force

Abstract Atoms, molecules, and nanoparticles can be spatially manipulated by an atomic force microscopy (AFM) tip, through van der Waals (vdW) and/or Coulomb forces. These point‐to‐point manipulations are highly accurate at nanoscale, facilitating the construction and modification of nanostructures....

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Bibliographic Details
Main Authors: Sheng Liu, Chee Fai Fong, Xue Liu, Beng Hau Tan, Qingyun Zeng, Yoshinori Okada, Nam‐Trung Nguyen, Hongjie An
Format: Article
Language:English
Published: Wiley-VCH 2024-03-01
Series:Advanced Materials Interfaces
Subjects:
2D semiconductor
conductive AFM
Coulomb Force
monolayers
optical properties
Online Access:https://doi.org/10.1002/admi.202300580

Internet

https://doi.org/10.1002/admi.202300580

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