Controlled Sixfold Symmetric Exfoliation of Oriented MoS2 Monolayers by Coulomb Force

Abstract Atoms, molecules, and nanoparticles can be spatially manipulated by an atomic force microscopy (AFM) tip, through van der Waals (vdW) and/or Coulomb forces. These point‐to‐point manipulations are highly accurate at nanoscale, facilitating the construction and modification of nanostructures....

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Main Authors: Sheng Liu, Chee Fai Fong, Xue Liu, Beng Hau Tan, Qingyun Zeng, Yoshinori Okada, Nam‐Trung Nguyen, Hongjie An
Format: Article
Language:English
Published: Wiley-VCH 2024-03-01
Series:Advanced Materials Interfaces
Subjects:
Online Access:https://doi.org/10.1002/admi.202300580
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author Sheng Liu
Chee Fai Fong
Xue Liu
Beng Hau Tan
Qingyun Zeng
Yoshinori Okada
Nam‐Trung Nguyen
Hongjie An
author_facet Sheng Liu
Chee Fai Fong
Xue Liu
Beng Hau Tan
Qingyun Zeng
Yoshinori Okada
Nam‐Trung Nguyen
Hongjie An
author_sort Sheng Liu
collection DOAJ
description Abstract Atoms, molecules, and nanoparticles can be spatially manipulated by an atomic force microscopy (AFM) tip, through van der Waals (vdW) and/or Coulomb forces. These point‐to‐point manipulations are highly accurate at nanoscale, facilitating the construction and modification of nanostructures. Nevertheless, it is difficult to manipulate 2D layers in vdW crystals by an AFM tip, because the tip‐induced attractive force is usually insufficient to outcompete the interlaminar vdW forces. Herein, manipulation of the surface layers on a MoS2 single crystal by a conductive AFM tip is successfully reported. By applying a bias between the tip and MoS2, the Coulomb attractive force allows the topmost MoS2 layers to be picked up. These exfoliated layers are deformed into micron‐sized bubbles with sixfold symmetry, which are composed of high‐quality monolayers and visually reflecting the hexagonal lattice orientation. The underlying mechanisms of the sixfold symmetric exfoliation and the formation of monolayers are discussed by in situ monitoring of the tunneling volt‐ampere characteristics and simulation of the force distribution. The findings open a new route to obtain high‐quality transition metal dichalcogenide (TMD) monolayers and their derived nanostructures on the surface of TMD single crystals for optoelectronic and photonic device applications.
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spelling doaj.art-4c415ada47ce4615908b18bfa4dfead02024-03-22T08:17:42ZengWiley-VCHAdvanced Materials Interfaces2196-73502024-03-01119n/an/a10.1002/admi.202300580Controlled Sixfold Symmetric Exfoliation of Oriented MoS2 Monolayers by Coulomb ForceSheng Liu0Chee Fai Fong1Xue Liu2Beng Hau Tan3Qingyun Zeng4Yoshinori Okada5Nam‐Trung Nguyen6Hongjie An7Quantum Materials Science Unit Okinawa Institute of Science and Technology Graduate University Okinawa 904‐0495 JapanNanoscale Quantum Photonics Laboratory RIKEN Cluster for Pioneering Research Saitama 351‐0198 JapanKey Laboratory of Structure and Functional Regulation of Hybrid Materials of Ministry of Education Institutes of Physical Science and Information Technology, Anhui University Hefei 230601 ChinaLow Energy Electronic Systems Singapore‐MIT Alliance for Research and Technology Singapore 138602 SingaporeCollege of Shipbuilding Engineering Harbin Engineering University Harbin 150001 ChinaQuantum Materials Science Unit Okinawa Institute of Science and Technology Graduate University Okinawa 904‐0495 JapanQueensland Micro and Nanotechnology Centre Griffith University 170 Kessels Road Nathan Queensland 4111 AustraliaQueensland Micro and Nanotechnology Centre Griffith University 170 Kessels Road Nathan Queensland 4111 AustraliaAbstract Atoms, molecules, and nanoparticles can be spatially manipulated by an atomic force microscopy (AFM) tip, through van der Waals (vdW) and/or Coulomb forces. These point‐to‐point manipulations are highly accurate at nanoscale, facilitating the construction and modification of nanostructures. Nevertheless, it is difficult to manipulate 2D layers in vdW crystals by an AFM tip, because the tip‐induced attractive force is usually insufficient to outcompete the interlaminar vdW forces. Herein, manipulation of the surface layers on a MoS2 single crystal by a conductive AFM tip is successfully reported. By applying a bias between the tip and MoS2, the Coulomb attractive force allows the topmost MoS2 layers to be picked up. These exfoliated layers are deformed into micron‐sized bubbles with sixfold symmetry, which are composed of high‐quality monolayers and visually reflecting the hexagonal lattice orientation. The underlying mechanisms of the sixfold symmetric exfoliation and the formation of monolayers are discussed by in situ monitoring of the tunneling volt‐ampere characteristics and simulation of the force distribution. The findings open a new route to obtain high‐quality transition metal dichalcogenide (TMD) monolayers and their derived nanostructures on the surface of TMD single crystals for optoelectronic and photonic device applications.https://doi.org/10.1002/admi.2023005802D semiconductorconductive AFMCoulomb Forcemonolayersoptical properties
spellingShingle Sheng Liu
Chee Fai Fong
Xue Liu
Beng Hau Tan
Qingyun Zeng
Yoshinori Okada
Nam‐Trung Nguyen
Hongjie An
Controlled Sixfold Symmetric Exfoliation of Oriented MoS2 Monolayers by Coulomb Force
Advanced Materials Interfaces
2D semiconductor
conductive AFM
Coulomb Force
monolayers
optical properties
title Controlled Sixfold Symmetric Exfoliation of Oriented MoS2 Monolayers by Coulomb Force
title_full Controlled Sixfold Symmetric Exfoliation of Oriented MoS2 Monolayers by Coulomb Force
title_fullStr Controlled Sixfold Symmetric Exfoliation of Oriented MoS2 Monolayers by Coulomb Force
title_full_unstemmed Controlled Sixfold Symmetric Exfoliation of Oriented MoS2 Monolayers by Coulomb Force
title_short Controlled Sixfold Symmetric Exfoliation of Oriented MoS2 Monolayers by Coulomb Force
title_sort controlled sixfold symmetric exfoliation of oriented mos2 monolayers by coulomb force
topic 2D semiconductor
conductive AFM
Coulomb Force
monolayers
optical properties
url https://doi.org/10.1002/admi.202300580
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