Controlled Sixfold Symmetric Exfoliation of Oriented MoS2 Monolayers by Coulomb Force
Abstract Atoms, molecules, and nanoparticles can be spatially manipulated by an atomic force microscopy (AFM) tip, through van der Waals (vdW) and/or Coulomb forces. These point‐to‐point manipulations are highly accurate at nanoscale, facilitating the construction and modification of nanostructures....
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Format: | Article |
Language: | English |
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Wiley-VCH
2024-03-01
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Series: | Advanced Materials Interfaces |
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Online Access: | https://doi.org/10.1002/admi.202300580 |
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author | Sheng Liu Chee Fai Fong Xue Liu Beng Hau Tan Qingyun Zeng Yoshinori Okada Nam‐Trung Nguyen Hongjie An |
author_facet | Sheng Liu Chee Fai Fong Xue Liu Beng Hau Tan Qingyun Zeng Yoshinori Okada Nam‐Trung Nguyen Hongjie An |
author_sort | Sheng Liu |
collection | DOAJ |
description | Abstract Atoms, molecules, and nanoparticles can be spatially manipulated by an atomic force microscopy (AFM) tip, through van der Waals (vdW) and/or Coulomb forces. These point‐to‐point manipulations are highly accurate at nanoscale, facilitating the construction and modification of nanostructures. Nevertheless, it is difficult to manipulate 2D layers in vdW crystals by an AFM tip, because the tip‐induced attractive force is usually insufficient to outcompete the interlaminar vdW forces. Herein, manipulation of the surface layers on a MoS2 single crystal by a conductive AFM tip is successfully reported. By applying a bias between the tip and MoS2, the Coulomb attractive force allows the topmost MoS2 layers to be picked up. These exfoliated layers are deformed into micron‐sized bubbles with sixfold symmetry, which are composed of high‐quality monolayers and visually reflecting the hexagonal lattice orientation. The underlying mechanisms of the sixfold symmetric exfoliation and the formation of monolayers are discussed by in situ monitoring of the tunneling volt‐ampere characteristics and simulation of the force distribution. The findings open a new route to obtain high‐quality transition metal dichalcogenide (TMD) monolayers and their derived nanostructures on the surface of TMD single crystals for optoelectronic and photonic device applications. |
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id | doaj.art-4c415ada47ce4615908b18bfa4dfead0 |
institution | Directory Open Access Journal |
issn | 2196-7350 |
language | English |
last_indexed | 2024-04-24T20:20:26Z |
publishDate | 2024-03-01 |
publisher | Wiley-VCH |
record_format | Article |
series | Advanced Materials Interfaces |
spelling | doaj.art-4c415ada47ce4615908b18bfa4dfead02024-03-22T08:17:42ZengWiley-VCHAdvanced Materials Interfaces2196-73502024-03-01119n/an/a10.1002/admi.202300580Controlled Sixfold Symmetric Exfoliation of Oriented MoS2 Monolayers by Coulomb ForceSheng Liu0Chee Fai Fong1Xue Liu2Beng Hau Tan3Qingyun Zeng4Yoshinori Okada5Nam‐Trung Nguyen6Hongjie An7Quantum Materials Science Unit Okinawa Institute of Science and Technology Graduate University Okinawa 904‐0495 JapanNanoscale Quantum Photonics Laboratory RIKEN Cluster for Pioneering Research Saitama 351‐0198 JapanKey Laboratory of Structure and Functional Regulation of Hybrid Materials of Ministry of Education Institutes of Physical Science and Information Technology, Anhui University Hefei 230601 ChinaLow Energy Electronic Systems Singapore‐MIT Alliance for Research and Technology Singapore 138602 SingaporeCollege of Shipbuilding Engineering Harbin Engineering University Harbin 150001 ChinaQuantum Materials Science Unit Okinawa Institute of Science and Technology Graduate University Okinawa 904‐0495 JapanQueensland Micro and Nanotechnology Centre Griffith University 170 Kessels Road Nathan Queensland 4111 AustraliaQueensland Micro and Nanotechnology Centre Griffith University 170 Kessels Road Nathan Queensland 4111 AustraliaAbstract Atoms, molecules, and nanoparticles can be spatially manipulated by an atomic force microscopy (AFM) tip, through van der Waals (vdW) and/or Coulomb forces. These point‐to‐point manipulations are highly accurate at nanoscale, facilitating the construction and modification of nanostructures. Nevertheless, it is difficult to manipulate 2D layers in vdW crystals by an AFM tip, because the tip‐induced attractive force is usually insufficient to outcompete the interlaminar vdW forces. Herein, manipulation of the surface layers on a MoS2 single crystal by a conductive AFM tip is successfully reported. By applying a bias between the tip and MoS2, the Coulomb attractive force allows the topmost MoS2 layers to be picked up. These exfoliated layers are deformed into micron‐sized bubbles with sixfold symmetry, which are composed of high‐quality monolayers and visually reflecting the hexagonal lattice orientation. The underlying mechanisms of the sixfold symmetric exfoliation and the formation of monolayers are discussed by in situ monitoring of the tunneling volt‐ampere characteristics and simulation of the force distribution. The findings open a new route to obtain high‐quality transition metal dichalcogenide (TMD) monolayers and their derived nanostructures on the surface of TMD single crystals for optoelectronic and photonic device applications.https://doi.org/10.1002/admi.2023005802D semiconductorconductive AFMCoulomb Forcemonolayersoptical properties |
spellingShingle | Sheng Liu Chee Fai Fong Xue Liu Beng Hau Tan Qingyun Zeng Yoshinori Okada Nam‐Trung Nguyen Hongjie An Controlled Sixfold Symmetric Exfoliation of Oriented MoS2 Monolayers by Coulomb Force Advanced Materials Interfaces 2D semiconductor conductive AFM Coulomb Force monolayers optical properties |
title | Controlled Sixfold Symmetric Exfoliation of Oriented MoS2 Monolayers by Coulomb Force |
title_full | Controlled Sixfold Symmetric Exfoliation of Oriented MoS2 Monolayers by Coulomb Force |
title_fullStr | Controlled Sixfold Symmetric Exfoliation of Oriented MoS2 Monolayers by Coulomb Force |
title_full_unstemmed | Controlled Sixfold Symmetric Exfoliation of Oriented MoS2 Monolayers by Coulomb Force |
title_short | Controlled Sixfold Symmetric Exfoliation of Oriented MoS2 Monolayers by Coulomb Force |
title_sort | controlled sixfold symmetric exfoliation of oriented mos2 monolayers by coulomb force |
topic | 2D semiconductor conductive AFM Coulomb Force monolayers optical properties |
url | https://doi.org/10.1002/admi.202300580 |
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