Rapid and accurate characterization of silver-paste metallization on crystalline silicon solar cells by contact-end voltage measurement
Contact-end voltage measurement was applied to characterize the contact-formation process of silver paste metallization on p- and n-type crystalline silicon solar cells under different temperatures with well-designed fixtures and test patterns based on the circular transmission line model. The conta...
| Main Authors: | , , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2018-09-01
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| Series: | AIP Advances |
| Online Access: | http://dx.doi.org/10.1063/1.5038127 |