Remaining Useful Life Prediction of IGBT Modules Across Working Conditions Based on ProbSparse Self-Attention
In order to improve the accuracy of remaining useful life (RUL) prediction of insulated gate bipolar transistor(IGBT) modules across working conditions to enhance their reliability, an RUL prediction method based on the ProbSparse self-attention mechanism and transfer learning was proposed based on...
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| Format: | Article |
| Language: | zho |
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Editorial Office of Journal of Shanghai Jiao Tong University
2023-08-01
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| Series: | Shanghai Jiaotong Daxue xuebao |
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| Online Access: | https://xuebao.sjtu.edu.cn/article/2023/1006-2467/1006-2467-57-8-1005.shtml |