Temporal dynamics of charge buildup in cryo-electron microscopy

It is well known that insulating samples can accumulate electric charges from exposure to an electron beam. How the accumulation of charge affects imaging parameters and sample stability in transmission electron microscopy is poorly understood. To quantify these effects, it is important to know how...

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Bibliographic Details
Main Authors: Makoto Tokoro Schreiber, Alan Maigné, Marco Beleggia, Satoshi Shibata, Matthias Wolf
Format: Article
Language:English
Published: Elsevier 2023-01-01
Series:Journal of Structural Biology: X
Subjects:
Online Access:http://www.sciencedirect.com/science/article/pii/S2590152422000228