Temporal dynamics of charge buildup in cryo-electron microscopy
It is well known that insulating samples can accumulate electric charges from exposure to an electron beam. How the accumulation of charge affects imaging parameters and sample stability in transmission electron microscopy is poorly understood. To quantify these effects, it is important to know how...
| Hlavní autoři: | , , , , |
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| Médium: | Článek |
| Jazyk: | English |
| Vydáno: |
Elsevier
2023-01-01
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| Edice: | Journal of Structural Biology: X |
| Témata: | |
| On-line přístup: | http://www.sciencedirect.com/science/article/pii/S2590152422000228 |