Comparison of silicon drift detectors made by Amptek and PNDetectors in application to the PHA system for W7-X
The paper presents comparison of two silicon drift detectors (SDD), one made by Amptek, USA, and the second one by PNDetector, Germany, which are considered for a soft X-ray diagnostic system for W7-X. The sensitive area of the first one is 7 mm2 × 450 μm and the second one is 10 mm2 × 450 μm. The f...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Sciendo
2016-12-01
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| Series: | Nukleonika |
| Subjects: | |
| Online Access: | https://doi.org/10.1515/nuka-2016-0067 |